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Spire Announces the Spi-ELa" Electroluminescence Solar Module Tester

^{Published on 2011-02-23 11:30:30 - Market Wire}
 

BEDFORD, Mass.--([ BUSINESS WIRE ])--[ Spire Corporation ] (Nasdaq: SPIR), a global solar company providing capital equipment and turn-key manufacturing lines to produce photovoltaic (PV) modules announced today the introduction of a new advanced metrology product, the Spi-ELa" Electroluminescence Solar Module Tester, at the SNEC 5^th (2011) International Photovoltaic Power Generation and Exhibition in Shanghai, China.

The Spi-EL series of solar module testers use electroluminescence (EL) to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared charge-coupled device camera technology to image each solar cell with resolutions less than 200 m per pixel, the equivalent of a 60 megapixel image for an entire module.

The Expo, where Spirea™s team members will discuss this new product, is currently taking place through February 24^th at the Shanghai New International Expo Center at booth E3-003. Attending the conference is Peter DiSessa, Ed Hurley, Shih-Yuan (Andy) Lin, and Mark Little from Spirea™s Sales and Marketing team.

About Spire Corporation

[ Spire Corporation ] is a global solar company providing capital equipment and turn-key production lines to manufacture PV modules. To learn more about Spire Corporation, visit [ www.SpireCorp.com ] or email [ PR@SpireCorp.com ].

Certain matters described in this press release may be forward-looking statements subject to risks and uncertainties that could cause actual results to differ materially from those indicated in the forward-looking statements. Such risks and uncertainties include, but are not limited to, the risk of dependence on market growth, competition and dependence on government agencies and other third parties for funding contract research and services, as well as other factors described in the Company's Form10-K and other periodic reports filed with the Securities and Exchange Commission.

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