

EMC-3D: Applied Materials Joins EMC-3D Equipment and Materials Consortium
SANTA CLARA, CA--(Marketwire - February 24, 2009) - The international EMC-3D semiconductor equipment and materials consortium today announced that Applied Materials, Inc. (
Through-silicon via technology is a new method of combining integrated circuits in a vertical stack to enable high functionality and low power consumption in a small footprint. While employing many standard chip processes, TSVs present several new technical challenges for production-worthy manufacturing: maintaining the structural and edge integrity of thin wafers, stress and thermal profile control, via processing and device reliability.
"Applied Materials sees the TSV approach as an important enabling technology for tomorrow's sophisticated image sensors, memory and mixed-signal applications," said Hans Stork, group vice president and CTO of Applied's Silicon Systems Group. "Joining forces with other leading equipment and materials suppliers is an effective way to qualify contiguous processes, drive down the cost and enable the widespread adoption of TSV technology. By deploying fabrication equipment, materials and process technology from the EMC-3D member companies, our customers can take advantage of a complete, validated process flow, greatly reducing their own development time and initial investment."
"We're very pleased to bring Applied Materials into this consortium and look forward to a productive relationship in developing cost-effective TSV solutions for chip stacking applications," said Paul Siblerud, EMC-3D chairman and vice president of marketing at Semitool (
The original goal of the consortium was to create a robust integrated process flow at a cost of less than $200USD per wafer. That goal has expanded to include both a via-first (iTSV™) and via-last (pTSV™) process flow at a total cost of ownership (CoO) of under $150USD.
About Applied Materials
Applied Materials, Inc. (
About EMC-3D
EMC-3D (Semiconductor 3D Equipment and Materials Consortium) was created in September 2006 to develop and market wafer level 3D chip stacking technology by demonstrating a cost-effective, manufacturable, stackable TSV interconnection process for IC and MEMS/Sensor packaging. [ www.EMC3D.org ]
*3D: three dimensional; MEMS: microelectromechanical systems
Contacts for EMC-3D Members include:
Equipment Members:
Applied Materials Inc., California USA; (
Technology: etching, dielectric and metal deposition, chemical-mechanical polishing, metrology, and inspection
Datacon Technology GmbH, Austria; Christoph Scheiring, Director Product Marketing
Technology: Precision Diebonding & Sorting
EV Group, Austria; Thorsten Matthias, Director of Technology North America
Technology: bonding, thin wafer handling, mask alignment lithography, conformal coat and develop
SEMITOOL Inc, USA; (
Technology: electroplating, metal/barrier etch, photoresist strip, wafer cleaning and thinning
Isonics Corp, USA; (
Technology: wafer service (reclaim and test wafers, wafer thinning, and thick-film SOI wafers)
Materials Members:
AZ Electronic Materials, USA; Aldo Orsi, Global Product Manager
Technology: positive and negative acting photoresists
Enthone (Cookson Electronics), USA; Yun Zhang, Director, Research and Development
Technology: chemistry for electroplating and metal etch
Rohm and Haas, USA; Bob Forman, Advanced Packaging Business Manager
Technology: chemistry for lithography, plating, etching, dielectric formation, and bonding
Brewer Science, Inc., USA; Mark Privett, Product Manager, Bonding Materials
Technology: Anti-reflective coatings, specialty materials for compound semiconductor, optoelectronics, and MEMS applications. Spin coat, bake and develop processing equipment, planarization systems
Technology Members:
CEA-LETI, Grenoble France; Mark Scannell, Microelectronics Program Manager
Fraunhofer IZM, Germany; Jürgen Wolf, Group and Project Manager
NXP, Dr. Fred Roozeboom, Technical Advisor
KAIST (Korea Advanced Institute of Science and Technology), Korea; Dr. Kyung-Wook Paik, Professor
SAIT (Samsung Advanced Institute of Technology), Korea; Dr. Yoon-Chul Sohn, Researcher
TAMU (Texas A&M University), USA; Dr. Manuel Soriaga, Professor