


ArcSight: ArcSight Logger 3.0 to Be Tested by SC Lab at World Congress
CUPERTINO, CA--(Marketwire - December 9, 2008) - ArcSight (
WHO: ArcSight Logger 3.0 will be tested in SC Magazine's virtual test lab at SC World Congress, held in New York City, on Tuesday, December 9, at 11:30 a.m. and Wednesday, December 10, at 10:30 a.m. The recently introduced product is a single appliance that captures, stores, alerts, searches and reports on log data. The cost-effective ArcSight Logger 3.0 represents a breakthrough in log data management, with industry-leading performance, efficiency, and scale. The 30-minute test will highlight the following areas: -- Performance -- Event information -- Search/reporting -- Features -- High speed log management -- High volume log management -- Industry-leading business analytics -- Ease of use -- Learning curve -- Integration with other products -- Bundled hardware and software -- Intuitive user interface -- Predefined reports -- Graphical reports The virtual test lab facilities will be provided courtesy of the Virtual Information Warfare Lab at Norwich University. The test will take place in SC Magazine's booth, 313. WHAT: SC World Congress 2008, located in New York City and hosted by SC Magazine, is the only dedicated IT security event in this location focused on providing the latest solutions and inside information to help IT and data security professionals do their jobs better. The event includes plenary sessions, featured speakers who are leaders in national and international security, panels that offer practical learning experiences, and conference sessions led by industry experts that will help attendees stay several steps ahead of emerging and unforeseen threats. The expo floor will feature vendors' latest innovations and solutions. WHEN & SC World Congress WHERE: December 9-10, 2008 Jacob K. Javits Convention Center 65 West 34th Street New York, NY 10001 To register for this event, visit [ http://www.scmagazineus.com/SC-World-Congress/section/381/ ]
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