Jordan Valley's QC3 Diffractometer Was Announced as the Winner of CS Industry Metrology Tool Awards 2013

[ Jordan Valley Semiconductor ], a market leader of X-Ray metrology tools, announced today that its QC3^™, a production worthy diffractometer for the compound semiconductor and LED industries, is the winner of CS Industry 2013 metrology, test and measurement award.

"The QC3^™ High-Resolution X-Ray Diffractometer is a true leapfrog technology over the existing X-ray technology within the compound semiconductor market" said Dr. Paul Ryan , Corporate VP and UK site manager.

[ The QC3^™ ] boasts more than an order-of-magnitude improvement in performance compared to previous systems, with scans taking seconds rather than minutes or even hours.

The productivity of the QC3^™ is further enhanced by the multi-sample stage that can accommodate up to 20 wafers in a single measurement process, with fully automated alignment, measurement, analysis and reporting, meaning an operator no longer needs to manually interpret and record data. The QC3^™ uses Jordan Valley's RADS analysis software to provide fast and accurate structural information from the X-Ray data. The RADS software is recognised as the industry leader in X-Ray analysis software.

These features of the QC3^™ system, coupled with the high data quality and throughput, leads to faster identification of epi excursions and their root causes, increasing yield and profit per wafer. Over 50 systems already shipped and installed in facilities across the world, mainly in China, Taiwan and USA.

The CS Industry Awards 2013 recognising success and development along the entire value chain of the Compound Semiconductor industry from research to completed device, focusing on the people, processes and products that drive the industry forward. The CS Industry Awards will remind us what is good about the industry - the people who drive it with their technical expertise and customer orientated perspectives. Nominations are open to all companies, individuals and organisations within the CS industry and voting will occur through Compound Semiconductor online and print services.

"Jordan Valley is extremely proud to be named as winner of CS industry award" says Isaac Mazor , Jordan Valley founder and CEO. "Our growth is a testament to our entire organization's commitment to technological superiority and to the wide adoption of our x-ray metrology into the advanced semiconductor manufacturing processes as well as other emerging markets such as the LED, GaN and other compound semiconductors."

About Jordan Valley Semiconductors Ltd. [ http://www.jvsemi.com ] Jordan Valley Semiconductors (JVS), the leader in X-ray metrology solutions for the semiconductor industry, develops manufactures and sells fully automated metrology tools for advanced technology nodes based on non-contacting and non-destructive tools.

The company offers the semiconductor industry the most comprehensive portfolio of advanced metrology tools, based on technologies such as XRR, XRF, XRD, HRXRD & XRDI (Imaging for defects).

Jordan Valley Semiconductors provides 2 other product to the Compound industry: [ Delta-X ] for LED and [ QC Velox ] that is the next generation HRXRD system for Epi manufactory.

Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE: CII), Intel Capital (NASDAQ: [ INTC ]) and Elron Electronics Industries Ltd. (TASE: ELRN).With headquarters in Migdal Haemek Israel, the company has subsidiaries in Durham UK, Austin Texas USA, Dresden, Germany, Hsin-Chu Taiwan, Suwon Korea and worldwide representatives network.

For more information:
Web site: [ http://www.jvsemi.com ]
Yuval Agami
Jordan Valley Semiconductors Ltd.
Phone: +97246543666x200
Email: [ Yuval.Agami@jordanvalley.com ]

Dr. Paul Ryan
Corporate VP, UK site manager
Jordan Valley Semiconductors UK Ltd.
Phone+ 441913324700
Email: [ Paul.Ryan@jvsemi.co.uk ]

SOURCE Jordan Valley Semicondutor

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Jordan Valley's QC3 Diffractometer Was Announced as the Winner of CS Industry Metrology Tool Awards 2013