Science and Technology Science and Technology
Wed, January 4, 2012
Tue, January 3, 2012

Nanometrics to Present at the 14th Annual Needham Growth Conference


Published on 2012-01-03 20:43:31 - Market Wire
  Print publication without navigation


MILPITAS, Calif.--([ ])--Nanometrics Incorporated (NASDAQ: NANO), a leading supplier of advanced process control systems and solutions, today announced that Dr. Timothy Stultz, president and chief executive officer, is scheduled to present at the 14th Annual Needham Growth Conference.

The conference will take place at the New York Palace Hotel in New York, NY, January 10-12, 2012. Nanometrics is scheduled to present on Thursday, January 12th at 2:50 PM ET.

The presentation material, along with a live audio webcast and archived recording of the presentation, will be made available on the investor page of Nanometricsa website at [ www.nanometrics.com ].

About Nanometrics

Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometricsa automated and integrated metrology and inspection systems provide for control of critical dimensions, device structures, overlay registration, topography, thin film properties, including film thickness as well as optical, electrical and material properties. The companyas process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometricsa systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Select Global Market under the symbol NANO. Nanometricsa website is [ www.nanometrics.com ].

Contributing Sources